US Patent Issued to TOYO SEIKAN on April 7 for "Method, program, apparatus, and system for abnormality detection such as for determining whether a plurality of containers to be stacked on a pallet is normal or abnormal" (Japanese Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,117, issued on April 7, was assigned to TOYO SEIKAN Co. LTD. (Tokyo).

"Method, program, apparatus, and system for abnormality detection such as for determining whether a plurality of containers to be stacked on a pallet is normal or abnormal" was invented by Takayuki Kikuchi (Yokohama, Japan), Junichi Takada (Yokohama, Japan), Kazuhiko Nakayama (Yokohama, Japan) and Taketoshi Manou (Yokohama, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An abnormality detection method includes: acquiring a determination target image that is an image of a determination target object to be regularly aligned while standing, which is a cylindrical container; cre...