US Patent Issued to Shenzhen Noyafa Electronic on Nov. 3 for "POE and cable tester with BT standard test" (Chinese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,409, issued on Nov. 3, was assigned to Shenzhen Noyafa Electronic Co. Ltd. (Shenzhen, China). "POE and cable tester with BT standard test" w... Read More

US Patent Issued to SUMITOMO ELECTRIC INDUSTRIES on Nov. 3 for "Detection device and detection method" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,410, issued on Nov. 3, was assigned to SUMITOMO ELECTRIC INDUSTRIES LTD. (Osaka, Japan). "Detection device and detection method" was invente... Read More

US Patent Issued to Siemens on Nov. 3 for "Arrangement having an insulation monitor, and it system" (German Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,411, issued on Nov. 3, was assigned to Siemens AG (Munich). "Arrangement having an insulation monitor, and it system" was invented by Robert... Read More

US Patent Issued to ELECTRIC POWER RESEARCH INSTITUTE OF GUANGDONG POWER GRID on Nov. 3 for "Method and apparatus for evaluating insulation performance of submarine cable, and medium" (Chinese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,412, issued on Nov. 3, was assigned to ELECTRIC POWER RESEARCH INSTITUTE OF GUANGDONG POWER GRID Co. LTD. (Guangzhou, China). "Method and ap... Read More

US Patent Issued to FUJI ELECTRIC on Nov. 3 for "Test jig, testing method, and method of manufacturing semiconductor device" (Japanese Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,413, issued on Nov. 3, was assigned to FUJI ELECTRIC Co. LTD. (Kawasaki, Japan). "Test jig, testing method, and method of manufacturing semi... Read More

US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING, TSMC CHINA on Nov. 3 for "Resistive-network cell region, built-in self-tester including same, semiconductor device including same, method of operating same and method of manufacturing same" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,414, issued on Nov. 3, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan) and TSMC CHINA COMPANY Ltd. (Shangha... Read More

US Patent Issued to BORGWARNER ORSENIGO on Nov. 3 for "Electronic circuit to verify the state of integrity of a diode" (Italian Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,415, issued on Nov. 3, was assigned to BORGWARNER ORSENIGO S.R.L. (Orsenigo, Italy). "Electronic circuit to verify the state of integrity of... Read More

US Patent Issued to Suzhou MetaBrain Intelligent Technology on Nov. 3 for "Transient voltage suppressor failure monitoring circuit" (Chinese Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,416, issued on Nov. 3, was assigned to Suzhou MetaBrain Intelligent Technology Co. Ltd. (Suzhou, China). "Transient voltage suppressor failu... Read More

US Patent Issued to AEHR TEST SYSTEMS on Nov. 3 for "Electronics tester" (California Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,417, issued on Nov. 3, was assigned to AEHR TEST SYSTEMS (Fremont, Calif.). "Electronics tester" was invented by Jovan Jovanovic (Santa Clar... Read More

US Patent Issued to AEHR TEST SYSTEMS on Nov. 3 for "Electronics tester" (California Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,418, issued on Nov. 3, was assigned to AEHR TEST SYSTEMS (Fremont, Calif.). "Electronics tester" was invented by Jovan Jovanovic (Santa Clar... Read More

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