ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,414, issued on Nov. 3, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan) and TSMC CHINA COMPANY Ltd. (Shanghai).
"Resistive-network cell region, built-in self-tester including same, semiconductor device including same, method of operating same and method of manufacturing same" was invented by Huan-Neng Chen (Hsinchu, Taiwan), Bo-Ting Chen (Hisnchu, Taiwan), Shao-Yu Li (Hsinchu, Taiwan), Chung-Lun Hong (Hsinchu, Taiwan) and Cun Cun Chen (Hsinchu, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A built-in self-tester (BIST) of a semiconductor device including: an input/output (I/O) circuit including an output buffe...