US Patent Issued to AEHR TEST SYSTEMS on Nov. 3 for "Electronics tester" (California Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,418, issued on Nov. 3, was assigned to AEHR TEST SYSTEMS (Fremont, Calif.).

"Electronics tester" was invented by Jovan Jovanovic (Santa Clara, Calif.), Kenneth W. Deboe (Santa Clara, Calif.), Steven C. Steps (Saratoga, Calif.) and Scott E. Lindsey (Brentwood, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a v...