US Patent Issued to KINSUS INTERCONNECT TECHNOLOGY on Nov. 3 for "Test fixture" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,389, issued on Nov. 3, was assigned to KINSUS INTERCONNECT TECHNOLOGY CORP. (Taoyuan City, Taiwan). "Test fixture" was invented by Ting-Hao ... Read More

US Patent Issued to CHUNGHWA PRECISION TEST TECH. on Nov. 3 for "Probe card device having parallel connection configuration and guide board mechanism thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,390, issued on Nov. 3, was assigned to CHUNGHWA PRECISION TEST TECH. Co. LTD. (Taoyuan City, Taiwan). "Probe card device having parallel con... Read More

US Patent Issued to IBIDEN on Nov. 3 for "Conduction inspection jig and method for manufacturing printed wiring board" (Japanese Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,391, issued on Nov. 3, was assigned to IBIDEN Co. Ltd. (Ogaki, Japan). "Conduction inspection jig and method for manufacturing printed wirin... Read More

US Patent Issued to MPI on Nov. 3 for "Probe cards, DUT side modules of the probe cards, testing methods and systems that include the probe cards, tested devices and methods of producing tested devices by utilizing the probe cards" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,392, issued on Nov. 3, was assigned to MPI Corp. (Chu-Pei City, Taiwan). "Probe cards, DUT side modules of the probe cards, testing methods ... Read More

US Patent Issued to NANYA TECHNOLOGY on Nov. 3 for "Method of testing semiconductor device" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,393, issued on Nov. 3, was assigned to NANYA TECHNOLOGY Corp. (New Taipei City, Taiwan). "Method of testing semiconductor device" was invent... Read More

US Patent Issued to Intelligent Memory on Nov. 3 for "Multiple tile wafer tester" (Chinese Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,394, issued on Nov. 3, was assigned to Intelligent Memory Ltd. (Kwai Chung, Hong Kong). "Multiple tile wafer tester" was invented by Peter P... Read More

US Patent Issued to MPI on Nov. 3 for "Membrane probe card, method of making the same and method of making tested semiconductor chip by using the same" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,395, issued on Nov. 3, was assigned to MPI Corp. (Chu-Pei City, Taiwan). "Membrane probe card, method of making the same and method of makin... Read More

US Patent Issued to ISABELLENHUETTE HEUSLER on Nov. 3 for "Current measuring resistor using a resistor element formed between two conduction elements with an associated circuit board and method of making the same" (German Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,396, issued on Nov. 3, was assigned to ISABELLENHUETTE HEUSLER GMBH & Co. KG (Dillenburg, Germany). "Current measuring resistor using a resi... Read More

US Patent Issued to Analog Devices International UnLtd. on Nov. 3 for "Current sensor" (British, Irish Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,397, issued on Nov. 3, was assigned to Analog Devices International UnLtd. Co. (Limerick, Ireland). "Current sensor" was invented by Bailey ... Read More

US Patent Issued to Allegro MicroSystems on Nov. 3 for "MR layout for current measurement" (American, French Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,398, issued on Nov. 3, was assigned to Allegro MicroSystems LLC (Manchester, N.H.). "MR layout for current measurement" was invented by Yann... Read More

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