US Patent Issued to CHUNGHWA PRECISION TEST TECH. on Nov. 3 for "Probe card device having parallel connection configuration and guide board mechanism thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,390, issued on Nov. 3, was assigned to CHUNGHWA PRECISION TEST TECH. Co. LTD. (Taoyuan City, Taiwan).

"Probe card device having parallel connection configuration and guide board mechanism thereof" was invented by Yu-Ju Lu (Taoyuan City, Taiwan), Hao-Yen Cheng (Taoyuan City, Taiwan), Rong-Yang Lai (Taoyuan City, Taiwan) and Wei-Jhih Su (Taichung City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A guide board mechanism includes two guide board modules spaced apart from each other. Each of the two guide board modules includes two guide boards, a spacing sheet sandwiched between the two guide boards, and at least two connection circuits that ar...