US Patent Issued to Allegro MicroSystems on Nov. 3 for "MR layout for current measurement" (American, French Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,398, issued on Nov. 3, was assigned to Allegro MicroSystems LLC (Manchester, N.H.).

"MR layout for current measurement" was invented by Yannick Vuillermet (La Motte Servolex, France) and Alexander Latham (Harvard, Mass.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus, including: a processing circuitry; a first magnetoresistance (MR) sensing element including a first sequence of first MR structures that are coupled to each other, the first sequence of first MR structures defining at least one first turn that is wound in a first direction; a second MR sensing element including a second sequence of second MR structures that are coupled to ea...