US Patent Issued to MPI on Nov. 3 for "Probe cards, DUT side modules of the probe cards, testing methods and systems that include the probe cards, tested devices and methods of producing tested devices by utilizing the probe cards" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,392, issued on Nov. 3, was assigned to MPI Corp. (Chu-Pei City, Taiwan).

"Probe cards, DUT side modules of the probe cards, testing methods and systems that include the probe cards, tested devices and methods of producing tested devices by utilizing the probe cards" was invented by Chin-Yi Lin (Chu-Pei City, Taiwan), Che-Wei Lin (Chu-Pei City, Taiwan), Hsueh-Chih Wu (Chu-Pei City, Taiwan), Tsung-Yi Chen (Chu-Pei City, Taiwan), Shang-Jung Hsieh (Chu-Pei City, Taiwan), Sheng-Yu Lin (Chu-Pei City, Taiwan), Chien-Kai Hung (Chu-Pei City, Taiwan), Sheng-Wei Lin (Chu-Pei City, Taiwan) and Shu-Jui Chang (Chu-Pei City, Taiwan).

According to the abstract* released by the U.S. Patent & Trade...