ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,440, issued on July 14, was assigned to Aptiv Technologies AG (Schaffhausen, Switzerland). "Method for detecting artifacts in infrared (IR)... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,441, issued on July 14, was assigned to KLA Corp. (Milpitas, Calif.). "Implementing image enhancement for improved defect detection" was in... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,442, issued on July 14, was assigned to Hitachi High-Tech Corp. (Tokyo). "Inspection system for detecting foreign material and scratch at e... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,443, issued on July 14. "Inspection methods for small bore pipes" was invented by Dayi Zhang (Glasgow, Great Britain), Gordon Ian Dobie (Du... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,444, issued on July 14, was assigned to Canon Virginia Inc. (Newport News, Va.). "Plant detection and display system" was invented by Hunte... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,445, issued on July 14, was assigned to CNH Industrial America LLC (New Holland, Pa.). "System and method for detecting worn, damaged, or m... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,446, issued on July 14, was assigned to LG Energy Solution Ltd. (Seoul, South Korea). "Non-destructive wire bonding inspection method" was ... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,447, issued on July 14, was assigned to CANON K.K. (Tokyo). "Inspection apparatus that extracts a predetermined area, inspection method, an... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,448, issued on July 14, was assigned to Bentley Systems Inc. (Exton, Pa.). "Machine vision-based techniques for non-contact structural heal... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,449, issued on July 14, was assigned to Relativity Space Inc. (Long Beach, Calif.). "Automated defect recognition and determinations of por... Read More