ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,440, issued on July 14, was assigned to Aptiv Technologies AG (Schaffhausen, Switzerland).
"Method for detecting artifacts in infrared (IR) illuminated IR images" was invented by Krzysztof Kaczor (Cracow, Poland).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to a computer implemented method for detecting artifacts in infrared (IR) illuminated IR images. Artifacts are separated from real objects by analyzing results of regression line fits to histograms of pixel values. Artifacts will have smooth transition gradients and therefore will show smaller deviations of the regression line fit to the histogram data."
The paten...