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US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on Sept. 15 for "Defect inspection method and defect inspection system" (Taiwanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,480, issued on Sept. 15, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan). "Defect inspection method and ... Read More


US Patent Issued to OmniZare Imaging on Sept. 15 for "Detecting and imaging using dielectric tomography" (Massachusetts Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,481, issued on Sept. 15, was assigned to OmniZare Imaging Inc. (Waltham, Mass.). "Detecting and imaging using dielectric tomography" was i... Read More


US Patent Issued to NTT on Sept. 15 for "System, method and device for checking blades of wind power plant" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,482, issued on Sept. 15, was assigned to NTT Inc. (Tokyo). "System, method and device for checking blades of wind power plant" was invente... Read More


US Patent Issued to General Electric on Sept. 15 for "Apparatuses, systems, and methods for three-dimensional, in-situ inspection of an additively manufactured component" (New York Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,483, issued on Sept. 15, was assigned to General Electric Co. (Evendale, Ohio). "Apparatuses, systems, and methods for three-dimensional, ... Read More


US Patent Issued to NUCTECH on Sept. 15 for "CT imaging system" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,484, issued on Sept. 15, was assigned to NUCTECH COMPANY Ltd. (Beijing). "CT imaging system" was invented by Li Zhang (Beijing), Zhiqiang ... Read More


US Patent Issued to Carl Zeiss X-ray Microscopy on Sept. 15 for "Multi-fraction sample holder for 3D particle analysis" (California Inventor)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,485, issued on Sept. 15, was assigned to Carl Zeiss X-ray Microscopy Inc. (Dublin, Calif.). "Multi-fraction sample holder for 3D particle ... Read More


US Patent Issued to SAUDI ARABIAN OIL on Sept. 15 for "Differentiation of clastic sedimentary systems using March-Dollase preferred orientation actor" (Saudi Arabia Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,486, issued on Sept. 15, was assigned to SAUDI ARABIAN OIL COMPANY (Dhahran, Saudi Arabia). "Differentiation of clastic sedimentary system... Read More


US Patent Issued to Hitachi High-Tech on Sept. 15 for "Inspection system" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,487, issued on Sept. 15, was assigned to Hitachi High-Tech Corp. (Tokyo). "Inspection system" was invented by Yohei Nakamura (Tokyo), Naok... Read More


US Patent Issued to SAMSUNG ELECTRONICS on Sept. 15 for "Wafer measurement apparatus and operating method thereof" (South Korean Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,488, issued on Sept. 15, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Wafer measurement apparatus and operating ... Read More


US Patent Issued to JEOL on Sept. 15 for "NMR measurement apparatus, and method of identifying solvent" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,489, issued on Sept. 15, was assigned to JEOL Ltd. (Tokyo). "NMR measurement apparatus, and method of identifying solvent" was invented by... Read More