ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,662, issued on April 21, was assigned to Mitsubishi Electric Research Laboratories Inc.. "Phase identification of power distribution syste... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,663, issued on April 21, was assigned to Electric Power Research Institute of Yunnan Power Grid Co. Ltd (Yunnan, China). "Method and syste... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,664, issued on April 21, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Transmitting and receiving circuit includi... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,665, issued on April 21, was assigned to SK hynix Inc. (Icheon-si, South Korea). "Electronic devices related to monitoring of internal nod... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,666, issued on April 21, was assigned to TEXAS INSTRUMENTS Inc. (Dallas). "Electrical and logic isolation for systems on a chip" was inven... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,667, issued on April 21, was assigned to Tektronix Inc. (Beaverton, Ore.). "System and method for detection of anomalies in test and measu... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,668, issued on April 21, was assigned to Lockheed Martin Corp. (Bethesda, Md.). "Systems and methods for wireless test modules of a wirele... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,669, issued on April 21, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Semiconductor chip and semiconductor packa... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,670, issued on April 21, was assigned to CHROMA ATE INC. (Taoyuan City, Taiwan). "Method and apparatus for testing a package-on-package se... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,671, issued on April 21, was assigned to MediaTek Inc. (Hsinchu City, Taiwan). "RF testing method and testing system" was invented by Jung... Read More