US Patent Issued to Tektronix on April 21 for "System and method for detection of anomalies in test and measurement results of a device under test (DUT)" (Indian Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,667, issued on April 21, was assigned to Tektronix Inc. (Beaverton, Ore.).

"System and method for detection of anomalies in test and measurement results of a device under test (DUT)" was invented by Siby Charley Pulikottil (Bengaluru, India), Sriram Mandyam Krishnakumar (Bengaluru, India) and Mahesha Guttahalli Lakshmipathy (Bengaluru, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test and measurement device has an interface, one or more connectors, each connector to allow the test and measurement device to connect to a test and measurement instrument, and one or more processors, the one or more processors configured to execute code to cau...