US Patent Issued to Dexerials on April 21 for "Protective element" (Japanese Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,261, issued on April 21, was assigned to Dexerials Corp. (Tochigi, Japan). "Protective element" was invented by Yoshihiro Yoneda (Shimotsu... Read More

US Patent Issued to VATECH, VATECH EWOO Holdings on April 21 for "Field emission X-ray source device" (South Korean Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,262, issued on April 21, was assigned to VATECH Co. Ltd. (Gyeonggi-do, South Korea) and VATECH EWOO Holdings Co. Ltd. (Gyeonggi-do, South K... Read More

US Patent Issued to SAMSUNG ELECTRONICS on April 21 for "Repeller for ion generating apparatus, ion generating apparatus and semiconductor wafer ion implantation apparatus" (South Korean Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,263, issued on April 21, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Gyeonggi-do, South Korea). "Repeller for ion generating apparatus, ... Read More

US Patent Issued to ASML Netherlands B. V. on April 21 for "Apparatus using enhanced deflectors to manipulate charged particle beams" (California Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,264, issued on April 21, was assigned to ASML Netherlands B. V. (Veldhoven, Netherlands). "Apparatus using enhanced deflectors to manipula... Read More

US Patent Issued to ASML Netherlands on April 21 for "Actuator arrangement and electron-optical column" (Dutch Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,265, issued on April 21, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Actuator arrangement and electron-optical column... Read More

US Patent Issued to JEOL on April 21 for "Sample cartridge holding apparatus" (Japanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,266, issued on April 21, was assigned to JEOL Ltd. (Tokyo). "Sample cartridge holding apparatus" was invented by Norimasa Sakuta (Tokyo), ... Read More

US Patent Issued to LEICA MIKROSYSTEME, LEICA MICROSYSTEMS CMS on April 21 for "Sample holder, loading device, and method for inserting a sample into a sample holder" (Austrian, German Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,267, issued on April 21, was assigned to LEICA MIKROSYSTEME GMBH (Vienna) and LEICA MICROSYSTEMS CMS GMBH (Wetzlar, Germany). "Sample hold... Read More

US Patent Issued to MiTeGen on April 21 for "Sample supports for cryo-electron microscopy" (New York Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,268, issued on April 21, was assigned to MiTeGen LLC (Ilthaca, N.Y.). "Sample supports for cryo-electron microscopy" was invented by Rober... Read More

US Patent Issued to Hitachi High-Tech on April 21 for "Inspection system" (Japanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,269, issued on April 21, was assigned to Hitachi High-Tech Corp. (Tokyo). "Inspection system" was invented by Natsuki Tsuno (Tokyo), Yasuh... Read More

US Patent Issued to FEI on April 21 for "Charged particle microscope for examining a specimen, and method of determining an aberration of said charged particle microscope" (Czech Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,270, issued on April 21, was assigned to FEI Co. (Hillsboro, Ore.). "Charged particle microscope for examining a specimen, and method of d... Read More

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