ALEXANDRIA, Va., May 26 -- United States Patent no. 12,640,212, issued on May 26, was assigned to Micron Technology Inc. (Boise, Idaho). "Efficient empty page scan operations" was invented by Lei Lin... Read More
ALEXANDRIA, Va., May 26 -- United States Patent no. 12,640,213, issued on May 26, was assigned to Micron Technology Inc. (Boise, Idaho). "Program verify compensation by sensing time modulation in a m... Read More
ALEXANDRIA, Va., May 26 -- United States Patent no. 12,640,214, issued on May 26, was assigned to Micron Technology Inc. (Boise, Idaho). "Access line voltage ramp rate adjustment" was invented by Yu-... Read More
ALEXANDRIA, Va., May 26 -- United States Patent no. 12,640,215, issued on May 26, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Memory devices with stacking circuits... Read More
ALEXANDRIA, Va., May 26 -- United States Patent no. 12,640,216, issued on May 26, was assigned to YANGTZE MEMORY TECHNOLOGIES Co. LTD. (Wuhan, China). "Memory system, method of operating memory syste... Read More
ALEXANDRIA, Va., May 26 -- United States Patent no. 12,640,217, issued on May 26, was assigned to Micron Technology Inc. (Boise, Idaho). "Apparatuses systems and methods for identification encoding f... Read More
ALEXANDRIA, Va., May 26 -- United States Patent no. 12,640,218, issued on May 26, was assigned to QUALCOMM Inc. (San Diego). "Error handling for reprojection timeline" was invented by Simon Peter Wil... Read More
ALEXANDRIA, Va., May 26 -- United States Patent no. 12,640,219, issued on May 26, was assigned to SambaNova Systems Inc. (Palo Alto, Calif.). "Method for scanning a memory array" was invented by Thom... Read More
ALEXANDRIA, Va., May 26 -- United States Patent no. 12,640,220, issued on May 26, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Bit counting circuits and memory devices inclu... Read More
ALEXANDRIA, Va., May 26 -- United States Patent no. 12,640,221, issued on May 26, was assigned to Advanced Micro Devices Inc. (Santa Clara, Calif.). "Host-to-device interface circuitry testing" was i... Read More