US Patent Issued to Micron Technology on May 26 for "Program verify compensation by sensing time modulation in a memory device with a defective deck" (California Inventors)

ALEXANDRIA, Va., May 26 -- United States Patent no. 12,640,213, issued on May 26, was assigned to Micron Technology Inc. (Boise, Idaho).

"Program verify compensation by sensing time modulation in a memory device with a defective deck" was invented by Yu-Chung Lien (San Jose, Calif.) and Zhenming Zhou (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A request to perform a program operation to program a set of memory cells on a memory device comprising a sense amplifier circuit is received. A defect indicator associated with the set of memory cells is determined to satisfy a defect condition. A modified sensing time period, exceeding a default sensing time period, is determined based on the def...