US Patent Issued to RIGAKU on April 21 for "Sample holder" (Japanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,580, issued on April 21, was assigned to RIGAKU Corp. (Tokyo). "Sample holder" was invented by Yohei Oka (Takatsuki, Japan), Koichi Aoyagi... Read More

US Patent Issued to OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS on April 21 for "Material analysis with multiple detectors" (British Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,581, issued on April 21, was assigned to OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS Ltd. (High Wycombe, Great Britain). "Material analysis wi... Read More

US Patent Issued to Thermo Electron Scientific Instruments on April 21 for "Optical extraction probe for electron microscope and other vacuum chambers" (Wisconsin, Ohio Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,582, issued on April 21, was assigned to Thermo Electron Scientific Instruments LLC (Madison, Wis.). "Optical extraction probe for electro... Read More

US Patent Issued to CHINA UNIVERSITY OF GEOSCIENCES (BEIJING) on April 21 for "Method for establishing mathematical model of relationship between spontaneous imbibition volume and time of porous medium" (Chinese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,583, issued on April 21, was assigned to CHINA UNIVERSITY OF GEOSCIENCES (BEIJING) (Beijing). "Method for establishing mathematical model ... Read More

US Patent Issued to United Semiconductor (Xiamen) on April 21 for "Reticle thermal expansion calibration method capable of improving sub-recipe" (Chinese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,584, issued on April 21, was assigned to United Semiconductor (Xiamen) Co. Ltd. (Xiamen, China). "Reticle thermal expansion calibration me... Read More

US Patent Issued to MITSUBISHI ELECTRIC on April 21 for "Method for measuring degradation of thermal resistance between power semiconductor and heat sink, and control device for power semiconductor" (French Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,585, issued on April 21, was assigned to MITSUBISHI ELECTRIC Corp. (Tokyo). "Method for measuring degradation of thermal resistance betwee... Read More

US Patent Issued to CHONGQING UNIVERSITY on April 21 for "Infrared thermal imaging defect detection method and apparatus for substation insulator" (Chinese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,586, issued on April 21, was assigned to CHONGQING UNIVERSITY (Chongqing, China). "Infrared thermal imaging defect detection method and ap... Read More

US Patent Issued to Sony Semiconductor Solutions on April 21 for "Potential measuring device" (Swiss Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,587, issued on April 21, was assigned to Sony Semiconductor Solutions Corp. (Kanagawa, Japan). "Potential measuring device" was invented b... Read More

US Patent Issued to Kyungpook National University Industry-Academic Cooperation Foundation on April 21 for "ZnO/carbon allotrope complex for sensing of low ppm formaldehyde gas and manufacturing method thereof" (South Korean Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,588, issued on April 21, was assigned to Kyungpook National University Industry-Academic Cooperation Foundation (Daegu, South Korea). "ZnO... Read More

US Patent Issued to Sorrento Therapeutics on April 21 for "Methods, assays and systems for detection of a target analyte" (Massachusetts, California, Pennsylvania Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,589, issued on April 21, was assigned to Sorrento Therapeutics Inc. (San Diego). "Methods, assays and systems for detection of a target an... Read More

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