US Patent Issued to CHONGQING UNIVERSITY on April 21 for "Infrared thermal imaging defect detection method and apparatus for substation insulator" (Chinese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,586, issued on April 21, was assigned to CHONGQING UNIVERSITY (Chongqing, China).

"Infrared thermal imaging defect detection method and apparatus for substation insulator" was invented by Ruotong Ming (Chongqing, China), Fan Yang (Chongqing, China), Pengbo Wang (Chongqing, China), Tian Tan (Chongqing, China), Hongrui Yi (Chongqing, China), Zhili Li (Chongqing, China), Zikang Yang (Chongqing, China) and Hui Jiang (Chongqing, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure discloses an infrared thermal imaging defect detection method and apparatus for a substation insulator. An infrared module is bidirectionally connected ...