ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,587, issued on April 21, was assigned to Sony Semiconductor Solutions Corp. (Kanagawa, Japan).
"Potential measuring device" was invented by Koji Ogawa (Zurich).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present technology relates to a potential measuring device capable of acquiring a signal of low-frequency bands of approximately 1 Hz to 300 Hz. The potential measuring device includes: a unit cell that includes a readout electrode for reading a predetermined potential as a displacement with respect to a reference potential, an amplifier circuit that includes a common-source amplifier, the readout electrode being connected to an input node of...