US Patent Issued to California Institute of Technology on June 2 for "Direct current-40 gigahertz coax-based cryogenic variable temperature load (VTL) with exceptional temporal response and linearity" (California Inventors)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,644,916, issued on June 2, was assigned to California Institute of Technology (Pasadena, Calif.). "Direct current-40 gigahertz coax-based cryoge... Read More

US Patent Issued on June 2 for "Rig for comparing wire harnesses" (Indian Inventor)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,644,917, issued on June 2. "Rig for comparing wire harnesses" was invented by Sandeep Suhas Patki (Pune, India). According to the abstract* rel... Read More

US Patent Issued to b2 electronics on June 2 for "Testing device and method for testing a high or medium-voltage cable" (Austrian Inventors)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,644,918, issued on June 2, was assigned to b2 electronics GMbH (Klaus, Austria). "Testing device and method for testing a high or medium-voltage... Read More

US Patent Issued on June 2 for "Advanced power MOS R DS-on driven lifetime prediction" (Italian Inventors)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,644,919, issued on June 2. "Advanced power MOS R DS-on driven lifetime prediction" was invented by Carmelo Pino (Catania, Italy), Francesco Rund... Read More

US Patent Issued to ROBERT BOSCH on June 2 for "Method for determining wear in an electronic unit, and test apparatus" (German Inventors)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,644,920, issued on June 2, was assigned to ROBERT BOSCH GMBH (Stuttgart, Germany). "Method for determining wear in an electronic unit, and test ... Read More

US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on June 2 for "Test circuit and method for operating the same" (Taiwanese Inventors)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,644,921, issued on June 2, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan). "Test circuit and method for opera... Read More

US Patent Issued to STMicroelectronics International on June 2 for "Real-time debug in low-power devices" (Indian Inventors)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,644,922, issued on June 2, was assigned to STMicroelectronics International N.V. (Geneva). "Real-time debug in low-power devices" was invented b... Read More

US Patent Issued to SAMSUNG ELECTRONICS on June 2 for "Circuit for detecting defects" (South Korean Inventors)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,644,923, issued on June 2, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Circuit for detecting defects" was invented by... Read More

US Patent Issued to PROTEANTECS on June 2 for "Die-to-die connectivity monitoring" (Israeli Inventors)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,644,924, issued on June 2, was assigned to PROTEANTECS LTD. (Haifa, Israel). "Die-to-die connectivity monitoring" was invented by Eyal Fayneh (G... Read More

US Patent Issued to Advanced Micro Devices on June 2 for "Supply chain security for chiplets" (New Mexico, Texas Inventors)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,644,925, issued on June 2, was assigned to Advanced Micro Devices Inc. (Santa Clara, Calif.). "Supply chain security for chiplets" was invented ... Read More

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