US Patent Issued to SAMSUNG ELECTRONICS on June 2 for "Circuit for detecting defects" (South Korean Inventors)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,644,923, issued on June 2, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Circuit for detecting defects" was invented by Takuya Futatsuyama (Suwon-si, South Korea), Wandong Kim (Suwon-si, South Korea) and Kiwhan Song (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A circuit for detecting defects includes a defect detection conductor provided in a peripheral region of a semiconductor die, an input pad connected to a first end of the defect detection conductor, an output pad connected to a second end of the defect detection conductor, a defect detection assembly connected to the defect detection conductor and c...