ALEXANDRIA, Va., June 9 -- United States Patent no. 12,651,322, issued on June 9, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Contour extraction method from inspection image in m... Read More
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,651,323, issued on June 9, was assigned to CANON K.K. (Tokyo). "Information processing apparatus, information processing system, and information... Read More
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,651,324, issued on June 9, was assigned to DEEPVISIONS Co. LTD. (Seoul, South Korea). "Image-based fine dust measurement method and system" was ... Read More
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,651,325, issued on June 9, was assigned to The United States of America as represented by the Secretary of the Navy. "Deep learning-based autofo... Read More
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,651,326, issued on June 9, was assigned to CITIZEN WATCH Co. LTD. (Tokyo). "Information display device, information display method, and non-tran... Read More
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,651,327, issued on June 9, was assigned to Deere & Co. (Moline, Ill.). "Machine-learned tillage shank malfunction in an autonomous farming vehic... Read More
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,651,328, issued on June 9, was assigned to Zhengzhou University (Zhengzhou, China). "Full-space intelligent detection method and system for unde... Read More
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,651,329, issued on June 9, was assigned to MOTOROLA SOLUTIONS INC. (Chicago). "System, device and method for detection of counterfeit electronic... Read More
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,651,330, issued on June 9, was assigned to Champion Link International Corp. (The Valley, Anguilla). "Method and system for determining a patter... Read More
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,651,331, issued on June 9, was assigned to SAP SE (Walldorf, Germany). "Semantic feature extraction for auto-labeling of defects" was invented b... Read More