US Patent Issued to DEEPVISIONS on June 9 for "Image-based fine dust measurement method and system" (South Korean Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,651,324, issued on June 9, was assigned to DEEPVISIONS Co. LTD. (Seoul, South Korea).

"Image-based fine dust measurement method and system" was invented by Bong Su Kang (Seoul, South Korea), Jun Sang Cho (Seoul, South Korea), Won Hee Jo (Seoul, South Korea), Nalinh Thoummala (Seoul, South Korea), Sung Jae Lee (Seoul, South Korea) and Hong Kyu Lee (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A fine dust measurement system includes a video photographing device that photographs a target place, generates a converted image or converted data by converting all or a portion of the photographed image and transmits the converted image or conv...