US Patent Issued to Champion Link International on June 9 for "Method and system for determining a pattern deviation value of a visible surface of a panel" (Chinese, Belgian Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,651,330, issued on June 9, was assigned to Champion Link International Corp. (The Valley, Anguilla).

"Method and system for determining a pattern deviation value of a visible surface of a panel" was invented by Thomas Luc Martine Baert (Sint-Martens-Latem, Belgium), Tom Van Poyer (Jiaxing, China) and Sven Boon (Jiaxing, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention relates to a method and system for determining a pattern deviation value of a top surface of a panel, in particular a top surface of a floor panel or wall panel. The method and system enable the calculation of a pattern deviation value based upon a determined pattern value...