US Patent Issued to New York University on May 19 for "Recirculation of a sample fluid for analysis in a microfluidic device" (New Jersey Inventor)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,660, issued on May 19, was assigned to New York University (New York). "Recirculation of a sample fluid for analysis in a microfluidic devic... Read More

US Patent Issued to HITACHI HIGH-TECH on May 19 for "Automatic analyzer and sample aspiration method in automatic analyzer" (Japanese Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,661, issued on May 19, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Automatic analyzer and sample aspiration method in automatic analyz... Read More

US Patent Issued to EPRO on May 19 for "Vibration monitors with indicator lights" (German Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,662, issued on May 19, was assigned to EPRO (Gronau, Germany). "Vibration monitors with indicator lights" was invented by Stephan Bloemer (G... Read More

US Patent Issued to GM GLOBAL TECHNOLOGY OPERATIONS on May 19 for "System and method for compensating wheel speed sensor signal latency" (Michigan Inventor)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,663, issued on May 19, was assigned to GM GLOBAL TECHNOLOGY OPERATIONS LLC (Detroit). "System and method for compensating wheel speed sensor... Read More

US Patent Issued to National Technology & Engineering Solutions of Sandia on May 19 for "Intertial sensor that includes fluids" (New Mexico, Texas Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,664, issued on May 19, was assigned to National Technology & Engineering Solutions of Sandia LLC (Albuquerque, N.M.). "Intertial sensor that... Read More

US Patent Issued to SEIKO EPSON on May 19 for "Inertial sensor, method for manufacturing inertial sensor, and inertial measurement unit" (Japanese Inventor)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,665, issued on May 19, was assigned to SEIKO EPSON Corp. (Japan). "Inertial sensor, method for manufacturing inertial sensor, and inertial m... Read More

US Patent Issued to University of Central Florida Research Foundation on May 19 for "Controlled creation of sub-50 nm defects in 2D materials at low temperature" (Florida Inventor)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,666, issued on May 19, was assigned to University of Central Florida Research Foundation Inc. (Orlando, Fla.). "Controlled creation of sub-5... Read More

US Patent Issued to SENSUS SPECTRUM on May 19 for "Electricity meter" (British Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,667, issued on May 19, was assigned to SENSUS SPECTRUM LLC (Morrisville, N.C.). "Electricity meter" was invented by Andrew Witty (Caerphilly... Read More

US Patent Issued to TDK-Micronas on May 19 for "Sensor device and sensor arrangement for determining an electrically induced magnetic field" (German Inventor)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,668, issued on May 19, was assigned to TDK-Micronas GmbH (Freiburg, Germany). "Sensor device and sensor arrangement for determining an elect... Read More

US Patent Issued to SOUTHEAST UNIVERSITY on May 19 for "Lossless exciting current sampling circuit for isolated converter" (Chinese Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,669, issued on May 19, was assigned to SOUTHEAST UNIVERSITY (Nanjing, China). "Lossless exciting current sampling circuit for isolated conve... Read More

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