US Patent Issued to University of Central Florida Research Foundation on May 19 for "Controlled creation of sub-50 nm defects in 2D materials at low temperature" (Florida Inventor)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,666, issued on May 19, was assigned to University of Central Florida Research Foundation Inc. (Orlando, Fla.).

"Controlled creation of sub-50 nm defects in 2D materials at low temperature" was invented by Laurene Tetard (Orlando, Fla.).

According to the abstract* released by the U.S. Patent & Trademark Office: "This disclosure relates to an method for the nanoscale creation of functional defects in 2D materials with the ability to control their dimensions and compositions."

The patent was filed on June 14, 2023, under Application No. 18/209,843.

*For further information, including images, charts and tables, please visit: http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2...