US Patent Issued to LEICA MIKROSYSTEME, LEICA MICROSYSTEMS CMS on April 21 for "Sample holder, loading device, and method for inserting a sample into a sample holder" (Austrian, German Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,267, issued on April 21, was assigned to LEICA MIKROSYSTEME GMBH (Vienna) and LEICA MICROSYSTEMS CMS GMBH (Wetzlar, Germany). "Sample hold... Read More

US Patent Issued to MiTeGen on April 21 for "Sample supports for cryo-electron microscopy" (New York Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,268, issued on April 21, was assigned to MiTeGen LLC (Ilthaca, N.Y.). "Sample supports for cryo-electron microscopy" was invented by Rober... Read More

US Patent Issued to Hitachi High-Tech on April 21 for "Inspection system" (Japanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,269, issued on April 21, was assigned to Hitachi High-Tech Corp. (Tokyo). "Inspection system" was invented by Natsuki Tsuno (Tokyo), Yasuh... Read More

US Patent Issued to FEI on April 21 for "Charged particle microscope for examining a specimen, and method of determining an aberration of said charged particle microscope" (Czech Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,270, issued on April 21, was assigned to FEI Co. (Hillsboro, Ore.). "Charged particle microscope for examining a specimen, and method of d... Read More

US Patent Issued to Advanced Energy Industries on April 21 for "High voltage power supplies for fast voltage changes" (Colorado Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,271, issued on April 21, was assigned to Advanced Energy Industries Inc. (Denver). "High voltage power supplies for fast voltage changes" ... Read More

US Patent Issued to Carl Zeiss Microscopy on April 21 for "Particle beam system" (German Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,272, issued on April 21, was assigned to Carl Zeiss Microscopy GmbH (Jena, Germany). "Particle beam system" was invented by Gero Walter (W... Read More

US Patent Issued to Japan Science and Technology Agency on April 21 for "Electron microscope, device for measuring electron-photon correlation, and method for measuring electron-photon correlation" (Japanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,273, issued on April 21, was assigned to Japan Science and Technology Agency (Saitama, Japan). "Electron microscope, device for measuring ... Read More

US Patent Issued to Hitachi High-Tech on April 21 for "Charged particle beam device" (Japanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,274, issued on April 21, was assigned to Hitachi High-Tech Corp. (Tokyo). "Charged particle beam device" was invented by Minami Shouji (To... Read More

US Patent Issued to GM GLOBAL TECHNOLOGY OPERATIONS on April 21 for "Orientation tool for electron backscatter diffraction" (Michigan Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,275, issued on April 21, was assigned to GM GLOBAL TECHNOLOGY OPERATIONS LLC (Detroit). "Orientation tool for electron backscatter diffrac... Read More

US Patent Issued to FEI on April 21 for "Mixed-gas species plasma source system" (Oregon Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,276, issued on April 21, was assigned to FEI Co. (Hillsboro, Ore.). "Mixed-gas species plasma source system" was invented by David Levi (H... Read More

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