US Patent Issued to Japan Science and Technology Agency on April 21 for "Electron microscope, device for measuring electron-photon correlation, and method for measuring electron-photon correlation" (Japanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,273, issued on April 21, was assigned to Japan Science and Technology Agency (Saitama, Japan).

"Electron microscope, device for measuring electron-photon correlation, and method for measuring electron-photon correlation" was invented by Takumi Sannomiya (Tokyo), Sotatsu Yanagimoto (Tokyo), Keiichirou Akiba (Tokyo) and Hikaru Saito (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electron microscope of an embodiment according to the present invention includes an electron gun for irradiating a sample with electrons; an electron detector for detecting the electrons with which the sample is irradiated; a photon detector for detecting photons em...