US Patent Issued to Siemens Shanghai Medical Equipment on May 12 for "Correction method for scatter signal caused by wedge filter" (Chinese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,092, issued on May 12, was assigned to Siemens Shanghai Medical Equipment Ltd. (Shanghai). "Correction method for scatter signal caused by w... Read More

US Patent Issued to NUCTECH, Tsinghua University on May 12 for "Radiographic inspection apparatus and vehicle-mounted security inspection system" (Chinese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,093, issued on May 12, was assigned to NUCTECH COMPANY Ltd. (Beijing) and Tsinghua University (Beijing). "Radiographic inspection apparatus ... Read More

US Patent Issued to Nuctech, Tsinghua University on May 12 for "Inspection system and inspection method" (Chinese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,094, issued on May 12, was assigned to Nuctech Co. Ltd. (Beijing) and Tsinghua University (Beijing). "Inspection system and inspection metho... Read More

US Patent Issued to Viken Detection on May 12 for "X-ray scanner with blanking" (Massachusetts Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,095, issued on May 12, was assigned to Viken Detection Corp. (Burlington, Mass.). "X-ray scanner with blanking" was invented by James P. Rya... Read More

US Patent Issued to Rolls-Royce on May 12 for "Measurement and determination of crystallographic texture with respect to position" (Indiana Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,096, issued on May 12, was assigned to Rolls-Royce Corp. (Indianapolis). "Measurement and determination of crystallographic texture with res... Read More

US Patent Issued to JOEL, TOHOKU UNIVERSITY on May 12 for "X-ray spectrum analysis apparatus and method" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,097, issued on May 12, was assigned to JOEL Ltd. (Tokyo) and TOHOKU UNIVERSITY (Sendai, Japan). "X-ray spectrum analysis apparatus and metho... Read More

US Patent Issued to Applied Materials Israel on May 12 for "Non-destructive classification of specimens based on energy signature measurements" (Israeli Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,098, issued on May 12, was assigned to Applied Materials Israel Ltd. (Rehovot, Israel). "Non-destructive classification of specimens based o... Read More

US Patent Issued to Korea Research Institute of Standards and Science on May 12 for "Method for characterizing energy level of core/shell nanoparticle" (South Korean Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,099, issued on May 12, was assigned to Korea Research Institute of Standards and Science (Daejeon, South Korea). "Method for characterizing ... Read More

US Patent Issued to THE UNIVERSITY OF NEW BRUNSWICK on May 12 for "Magnetic resonance method and system for characterizing circular Couette flow of fluids" (Canadian Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,100, issued on May 12, was assigned to THE UNIVERSITY OF NEW BRUNSWICK (Fredericton, Canada). "Magnetic resonance method and system for char... Read More

US Patent Issued to CARRIER on May 12 for "Method for identifying a state of a stream of refrigerant" (Polish Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,101, issued on May 12, was assigned to CARRIER Corp. (Palm Beach Gardens, Fla.). "Method for identifying a state of a stream of refrigerant"... Read More

• ««
• «
• 2130
• 2131
• 2132
• 2133
• 2134
• 2135
• 2136
• 2137
• 2138
• 2139
• »
• »»