US Patent Issued to Applied Materials Israel on May 12 for "Non-destructive classification of specimens based on energy signature measurements" (Israeli Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,098, issued on May 12, was assigned to Applied Materials Israel Ltd. (Rehovot, Israel).

"Non-destructive classification of specimens based on energy signature measurements" was invented by Doron Girmonsky (Raanana, Israel), Uri Hadar (Tel Aviv, Israel), Dror Shemesh (Hod Hasharon, Israel) and Michal Eilon (Beit-Elazari, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed herein is a system for non-destructive classification of specimens. The system includes an e-beam source, an X-ray measurement module, and a computational module. The e-beam source is configured to project e-beams on a specimen at one or more e-beam landing energies, so a...