ALEXANDRIA, Va., May 12 -- United States Patent no. 12,628,612, issued on May 12, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Magnetic sensor assembly for a substrate process stati... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,628,613, issued on May 12, was assigned to SEMES Co. LTD. (Cheonan-si, South Korea). "Transport vehicle cleaning device and article transport eq... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,628,614, issued on May 12, was assigned to Tokyo Electron Ltd. (Tokyo). "Bonding apparatus, bonding system, and bonding method" was invented by ... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,628,615, issued on May 12, was assigned to ENKRIS SEMICONDUCTOR INC. (Suzhou, China). "Semiconductor structure" was invented by Kai Liu (Suzhou,... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,628,616, issued on May 12, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Wafer chuck table and wafer chuck system" was ... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,628,617, issued on May 12, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Wafer chuck including self-sealing va... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,628,618, issued on May 12, was assigned to POSTECH RESEARCH AND BUSINESS DEVELOPMENT FOUNDATION (Pohang-si, South Korea). "Apparatus and method ... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,628,619, issued on May 12, was assigned to LG DISPLAY Co. LTD. (Seoul, South Korea). "Display device" was invented by Seeun Kim (Seoul, South Ko... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,628,620, issued on May 12, was assigned to Meta Platforms Inc. (Menlo Park, Calif.). "Die level integrated connection test circuit and method th... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,628,621, issued on May 12, was assigned to NANYA TECHNOLOGY Corp. (New Taipei City, Taiwan). "Semiconductor structure and method of overlay meas... Read More