US Patent Issued to ELTEK on May 5 for "Sensor device for monitoring the dielectric strength of a dielectric fluid, in particular a fluid for the thermal conditioning of a battery" (Italian Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,891, issued on May 5, was assigned to ELTEK S.p.A. (Casale Monferrato, Italy). "Sensor device for monitoring the dielectric strength of a die... Read More

US Patent Issued to TMEIC on May 5 for "Insulation diagnostic device and insulation diagnostic method" (Japanese Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,892, issued on May 5, was assigned to TMEIC Corp. (Tokyo). "Insulation diagnostic device and insulation diagnostic method" was invented by Ka... Read More

US Patent Issued to SK hynic on May 5 for "Apparatus and method of measuring reliability for flash memory material through a current measurement" (South Korean Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,893, issued on May 5, was assigned to SK hynic Inc. (Icheon-si, South Korea). "Apparatus and method of measuring reliability for flash memory... Read More

US Patent Issued to Hewlett Packard Enterprise Development on May 5 for "Universal socket test card" (American, Taiwanese Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,894, issued on May 5, was assigned to Hewlett Packard Enterprise Development LP (Spring, Texas). "Universal socket test card" was invented by... Read More

US Patent Issued to NXP on May 5 for "Test system for detecting faults in multiple devices of the same type" (Dutch, German Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,895, issued on May 5, was assigned to NXP B.V. (Eindhoven, Netherlands). "Test system for detecting faults in multiple devices of the same ty... Read More

US Patent Issued to Advantest Test Solutions on May 5 for "Active thermal interposer device with thermal isolation structures" (California Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,896, issued on May 5, was assigned to Advantest Test Solutions Inc. (San Jose, Calif.). "Active thermal interposer device with thermal isolat... Read More

US Patent Issued to Mitsubishi Electric on May 5 for "Test apparatus for semiconductor device and method of manufacturing semiconductor device" (Japanese Inventor)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,897, issued on May 5, was assigned to Mitsubishi Electric Corp. (Tokyo). "Test apparatus for semiconductor device and method of manufacturing... Read More

US Patent Issued to Synopsys on May 5 for "Neighborhood built-in self-test noise generation" (South Carolina Inventor)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,898, issued on May 5, was assigned to Synopsys Inc. (Sunnyvale, Calif.). "Neighborhood built-in self-test noise generation" was invented by A... Read More

US Patent Issued to JF MICROTECHNOLOGY SDN. BHD. on May 5 for "Method for aligning contact pins in an integrated circuit testing apparatus" (Malaysian Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,899, issued on May 5, was assigned to JF MICROTECHNOLOGY SDN. BHD. (Petaling Jaya, Malaysia). "Method for aligning contact pins in an integra... Read More

US Patent Issued to Intel on May 5 for "Wafer level electron beam prober" (Oregon Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,900, issued on May 5, was assigned to Intel Corp. (Santa Clara, Calif.). "Wafer level electron beam prober" was invented by Xianghong Tong (H... Read More

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