US Patent Issued to Synopsys on May 5 for "Neighborhood built-in self-test noise generation" (South Carolina Inventor)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,898, issued on May 5, was assigned to Synopsys Inc. (Sunnyvale, Calif.).

"Neighborhood built-in self-test noise generation" was invented by Adam D. Cron (Hilton Head Island, S.C.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Built-in self-test (BIST) may be run on a set of circuits in proximity to a circuit under test (CUT) in an integrated circuit (IC) chip to generate noise and voltage drop conditions in the CUT. BIST may be run on the CUT while BIST is running on the set of circuits. A result of running the BIST on the CUT may be determined. The result may be associated with the noise and voltage drop conditions."

The patent was filed on April 26...