US Patent Issued to Intel on May 5 for "Wafer level electron beam prober" (Oregon Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,900, issued on May 5, was assigned to Intel Corp. (Santa Clara, Calif.).

"Wafer level electron beam prober" was invented by Xianghong Tong (Hillsboro, Ore.), Martin Von Haartman (Portland, Ore.), Zhiyong Ma (Hillsboro, Ore.), Jennifer J. Huening (Hillsboro, Ore.), Hyuk Ju Ryu (Hillsboro, Ore.), Christopher Morgan (Portland, Ore.), Shuai Zhao (Beaverton, Ore.), Ramune Nagisetty (Portland, Ore.), Tuyen K. Tran (Portland, Ore.) and Wen-Hsien Chuang (Portland, Ore.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Wafer level electron beam prober systems, devices, and techniques, are described herein related to providing wafer level testing for fabricated de...