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US Patent Issued to Roche Diagnostics Operations on Oct. 20 for "Laboratory apparatus, laboratory sample handling system and use of a laboratory apparatus and/or a laboratory sample handling system" (German Inventor)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,851, issued on Oct. 20, was assigned to Roche Diagnostics Operations Inc. (Indianapolis). "Laboratory apparatus, laboratory sample handling... Read More


US Patent Issued to HITACHI HIGH-TECH on Oct. 20 for "Automatic analyzer" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,852, issued on Oct. 20, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Automatic analyzer" was invented by Shugo Okabe (Tokyo) and Taken... Read More


US Patent Issued to HITACHI HIGH-TECH on Oct. 20 for "Automatic analyzer" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,853, issued on Oct. 20, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Automatic analyzer" was invented by Satoshi Nakajima (Tokyo) and ... Read More


US Patent Issued to HITACHI HIGH-TECH on Oct. 20 for "Automatic analyzer" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,854, issued on Oct. 20, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Automatic analyzer" was invented by Yuka Miyake (Tokyo), Koshin H... Read More


US Patent Issued to GILSON on Oct. 20 for "Positive-displacement sampling device designed to improve the grasping of the piston of a piston-capillary system" (French Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,855, issued on Oct. 20, was assigned to GILSON SAS (Villiers-le-Bel, France). "Positive-displacement sampling device designed to improve th... Read More


US Patent Issued to GENE TARGET TECHNOLOGY on Oct. 20 for "Automated interpretation system for quantitative and qualitative analysis of biochips" (Taiwanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,856, issued on Oct. 20, was assigned to GENE TARGET TECHNOLOGY Co. LTD. (Kaohsiung, Taiwan). "Automated interpretation system for quantitat... Read More


US Patent Issued to CRRC QINGDAO SIFANG on Oct. 20 for "Method and device for testing positioning and speed measuring system main unit" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,857, issued on Oct. 20, was assigned to CRRC QINGDAO SIFANG Co. LTD. (Qingdao, China). "Method and device for testing positioning and speed... Read More


US Patent Issued to YAMAICHI ELECTRONICS on Oct. 20 for "Contact pin and socket for inspection" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,858, issued on Oct. 20, was assigned to YAMAICHI ELECTRONICS Co. LTD. (Tokyo). "Contact pin and socket for inspection" was invented by Juni... Read More


US Patent Issued to SAMSUNG ELECTRONICS, KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY on Oct. 20 for "Test apparatus and test method thereof" (South Korean Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,859, issued on Oct. 20, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea) and KOREA ADVANCED INSTITUTE OF SCIENCE AND TEC... Read More


US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on Oct. 20 for "Probe head structure" (Taiwanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,860, issued on Oct. 20, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan). "Probe head structure" was inven... Read More