US Patent Issued to SAMSUNG ELECTRONICS, KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY on Oct. 20 for "Test apparatus and test method thereof" (South Korean Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,859, issued on Oct. 20, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea) and KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY (Suwon-si, South Korea).

"Test apparatus and test method thereof" was invented by Sungyoon Ryu (Seoul, South Korea), Seungbum Hong (Daejeon, South Korea), Kwangeun Kim (Suwon-si, South Korea), Hoon Kim (Daejeon, South Korea), Jiwon Yeom (Daejeon, South Korea), Seokjung Yun (Iksan-si, South Korea), Souk Kim (Seoul, South Korea), Younghoon Sohn (Seoul, South Korea) and Yusin Yang (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test apparatus includes a movable stage to support a sam...