ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,260, issued on Aug. 11, was assigned to LUCID SOFTWARE INC. (South Jordan, Utah). "User-defined graphical cross-layout with intersection ar... Read More
ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,261, issued on Aug. 11, was assigned to HATHA SYSTEMS LLC (Washington). "System and method for determining and representing a lineage of bu... Read More
ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,262, issued on Aug. 11, was assigned to HANGZHOU YILINGERSI INFORMATION TECHNOLOGY Co. LTD. (Hangzhou, China). "Methods, systems, and stora... Read More
ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,263, issued on Aug. 11, was assigned to Federal Home Loan Mortage Corporation (Freddie Mac) (McLean, Va.). "Systems and methods of establis... Read More
ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,264, issued on Aug. 11, was assigned to eBay Inc. (San Jose, Calif.). "Search system for providing search results using query understanding... Read More
ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,265, issued on Aug. 11, was assigned to Cisco Technology Inc. (San Jose, Calif.). "Computer network monitoring and control using a fine-tun... Read More
ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,540, issued on Aug. 11, was assigned to UNIVERSITE GUSTAVE EIFFEL (Champs sur Marne, France). "Method and device for measuring the state of... Read More
ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,541, issued on Aug. 11, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Testing module and testing method u... Read More
ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,542, issued on Aug. 11, was assigned to Kethley Instruments LLC (Solon, Ohio). "MEMS device measurements using pulse measure unit" was inve... Read More
ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,543, issued on Aug. 11, was assigned to SK hynix Inc. (Icheon-si, South Korea). "Wafer analyzing device and wafer analyzing system" was inv... Read More