US Patent Issued to SK hynix on Aug. 11 for "Wafer analyzing device and wafer analyzing system" (South Korean Inventor)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,543, issued on Aug. 11, was assigned to SK hynix Inc. (Icheon-si, South Korea).

"Wafer analyzing device and wafer analyzing system" was invented by Tae Beom Kim (Icheon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor wafer analyzing device and semiconductor wafer analyzing system are disclosed that provide estimated analysis values of unit areas that are not measured in a target wafer. The device and system calculate estimated analysis values based on measured analysis values of unit areas in a basic wafer and measured analysis values of some unit areas in the target wafer."

The patent was filed on Nov. 28, 2023, unde...