ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,464, issued on Aug. 18, was assigned to DAC System SA (Manno, Switzerland). "Fault detection method" was invented by Paolo Delmastro (Laina... और पढ़ें
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,465, issued on Aug. 18, was assigned to LS CABLE & SYSTEM LTD. (Anyang-si, South Korea). "Partial discharge monitoring system and partial d... और पढ़ें
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,466, issued on Aug. 18, was assigned to Arizona Board of Regents on Behalf of Arizona State University (Tempe, Ariz.). "Systems and methods... और पढ़ें
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,467, issued on Aug. 18, was assigned to NANYA TECHNOLOGY Corp. (New Taipei City, Taiwan). "Wafer tester and wafer testing method and system... और पढ़ें
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,468, issued on Aug. 18, was assigned to MICROTEST S.P.A. (Vicopisano, Italy). "Method and system of developing and executing test program f... और पढ़ें
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,469, issued on Aug. 18, was assigned to Rohde & Schwarz GmbH & Co. KG (Munich). "Modular positioner and/or fixture, measurement system and ... और पढ़ें
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,470, issued on Aug. 18, was assigned to Thermal Solution Technology Co. Ltd. (Tokyo). "Apparatus for testing semiconductor device test" was... और पढ़ें
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,471, issued on Aug. 18, was assigned to YANGTZE MEMORY TECHNOLOGIES Co. LTD. (Wuhan, China). "Semiconductor package" was invented by Zhiguo... और पढ़ें
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,473, issued on Aug. 18, was assigned to Analog Devices International UnLtd. Co. (Limerick, Ireland). "Fault detection for switched-mode con... और पढ़ें
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,475, issued on Aug. 18, was assigned to HAHN AUTOMATION GMBH (Rheinbollen, Germany). "Switching device for a test bench for electrical comp... और पढ़ें