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US Patent Issued to STMICROELECTRONICS INTERNATIONAL on Aug. 25 for "Fail-safe and high voltage tolerant test control circuitry for an integrated circuit (IC)" (Indian Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,939, issued on Aug. 25, was assigned to STMICROELECTRONICS INTERNATIONAL N.V. (Geneva). "Fail-safe and high voltage tolerant test control c... Read More


US Patent Issued on Aug. 25 for "Wafer probing apparatus with probe card positioning module" (Taiwanese Inventor)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,940, issued on Aug. 25. "Wafer probing apparatus with probe card positioning module" was invented by Chien Wen Chang (Taoyuan City, Taiwan)... Read More


US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on Aug. 25 for "Benchmark circuit on a semiconductor wafer and method for operating the same" (Taiwanese Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,941, issued on Aug. 25, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan). "Benchmark circuit on a semicond... Read More


US Patent Issued to NXP on Aug. 25 for "System and method for controlling at-speed testing of integrated circuits" (Indian Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,942, issued on Aug. 25, was assigned to NXP B.V. (Eindhoven, Netherlands). "System and method for controlling at-speed testing of integrate... Read More


US Patent Issued to SAMSUNG ELECTRONICS on Aug. 25 for "Integrated circuit, memory device including the integrated circuit, and method of operating the same" (South Korean Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,943, issued on Aug. 25, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Integrated circuit, memory device including ... Read More


US Patent Issued to QUALCOMM on Aug. 25 for "Integrated circuit including constant-0 flip flops reconfigured to provide observable and controllable test points" (Texas Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,944, issued on Aug. 25, was assigned to QUALCOMM Inc. (San Diego). "Integrated circuit including constant-0 flip flops reconfigured to prov... Read More


US Patent Issued to SK hynix on Aug. 25 for "Secure scan testing of integrated circuits" (California Inventor)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,945, issued on Aug. 25, was assigned to SK hynix Inc. (Gyeonggi-do, South Korea). "Secure scan testing of integrated circuits" was invented... Read More


US Patent Issued to dSPACE on Aug. 25 for "Testing a control device using a test assembly" (German Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,946, issued on Aug. 25, was assigned to dSPACE SE & Co. KG (Paderborn, Germany). "Testing a control device using a test assembly" was inven... Read More


US Patent Issued to University of South Carolina on Aug. 25 for "Lebesgue-sampling-based li-battery whole-service-life soc estimation using simplified first principle (SFP) model" (South Carolina Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,947, issued on Aug. 25, was assigned to University of South Carolina (Columbia, S.C.). "Lebesgue-sampling-based li-battery whole-service-li... Read More


US Patent Issued to Renesas Electronics on Aug. 25 for "Battery simulator" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,948, issued on Aug. 25, was assigned to Renesas Electronics Corp. (Tokyo). "Battery simulator" was invented by Tetsuji Tsuda (Tokyo) and Sa... Read More