US Patent Issued to STMICROELECTRONICS INTERNATIONAL on Aug. 25 for "Fail-safe and high voltage tolerant test control circuitry for an integrated circuit (IC)" (Indian Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,939, issued on Aug. 25, was assigned to STMICROELECTRONICS INTERNATIONAL N.V. (Geneva).

"Fail-safe and high voltage tolerant test control circuitry for an integrated circuit (IC)" was invented by Rik Paul (Kolkata, India) and Rajesh Narwal (Greater Noida, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "An example circuit and an electrical system utilizing test control circuitry to manage the transmission of electrical test signals between an integrated circuit and a main board are provided. The circuit includes test control circuitry configured to selectively transmit electrical test signals between an IC and a pad interface based on a pluralit...