US Patent Issued to SK hynix on Aug. 25 for "Secure scan testing of integrated circuits" (California Inventor)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,945, issued on Aug. 25, was assigned to SK hynix Inc. (Gyeonggi-do, South Korea).

"Secure scan testing of integrated circuits" was invented by Vladimir Valentinovich Kovalev (Hayward, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Techniques for scan testing integrated circuits that process sensitive data while protecting such data from unauthorized access. A second scan register is provided in parallel to a primary scan register, the second scan register functionally replicating the primary scan register. The primary and replica scan registers are scan loadable (i.e., can be loaded with scan data) but are non-scannable (i.e., not scan readab...