ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,111, issued on Nov. 3, was assigned to Onto Innovation Inc. (Wilmington, Mass.). "Metrology device with wavelength-frequency multiplexing" w... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,112, issued on Nov. 3, was assigned to NIKON Corp. (Tokyo). "Position-measuring device, position-measuring system, and measuring device" was... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,113, issued on Nov. 3, was assigned to MITUTOYO Corp. (Kanagawa, Japan). "Coordinate measuring machine and in-line measurement system" was i... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,114, issued on Nov. 3, was assigned to LG Energy Solution Ltd. (Seoul, South Korea). "Device and method for measuring sealing gap for second... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,115, issued on Nov. 3, was assigned to OncoRes Medical Pty Ltd (Nedlands, Australia). "Attachment for an elastography and/or imaging device"... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,116, issued on Nov. 3, was assigned to II-VI DELAWARE INC. (Wilmington, Del.). "Sensor with addressable depth range and/or field of view and... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,117, issued on Nov. 3, was assigned to Breitmeier Messtechnik GmbH (Ettlingen, Germany). "Method for optically measuring technical surfaces,... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,118, issued on Nov. 3, was assigned to Nikon Corp. (Tokyo). "Systems and methods for measuring height properties of surfaces" was invented b... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,119, issued on Nov. 3, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Off-axis motion characterization of a linear actuator"... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,120, issued on Nov. 3, was assigned to KOH YOUNG TECHNOLOGY INC. (Seoul, South Korea). "Apparatus and method for measuring a three dimension... और पढ़ें