US Patent Issued to NIKON on Nov. 3 for "Position-measuring device, position-measuring system, and measuring device" (Japanese Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,112, issued on Nov. 3, was assigned to NIKON Corp. (Tokyo).

"Position-measuring device, position-measuring system, and measuring device" was invented by Shinji Sato (Fukaya, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A position measurement device includes a movement device capable of movement, a position measurement unit including an irradiation unit configured to irradiate measurement light to a reflective element arranged on a movable unit of a robot, a light reception unit configured to receive reflected light from the reflective element, a position information acquisition unit configured to acquire position information of the reflective...