ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,111, issued on Nov. 3, was assigned to Onto Innovation Inc. (Wilmington, Mass.).
"Metrology device with wavelength-frequency multiplexing" was invented by Alexander George Boosalis (Lake Oswego, Ore.).
According to the abstract* released by the U.S. Patent & Trademark Office: "An optical metrology device collects data in parallel by multiplexing wavelength and associated frequencies using computer control and electro-optics in a wavelength modulator. The wavelength modulator includes a pair of crossed polarizers and an electro-optical modulator, such as a Pockels cell or Faraday rotator, disposed between the polarizers. The electro-optical modulator modulates the polarization stat...