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US Patent Issued to CANON on June 30 for "Image processing apparatus, image processing method, and non-transitory computer-readable storage medium" (Japanese Inventor)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,564, issued on June 30, was assigned to CANON K.K. (Tokyo). "Image processing apparatus, image processing method, and non-transitory comput... और पढ़ें


US Patent Issued to Honor Device on June 30 for "Image processing method and electronic device" (Chinese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,565, issued on June 30, was assigned to Honor Device Co. Ltd. (Shenzhen, China). "Image processing method and electronic device" was invent... और पढ़ें


US Patent Issued to Koninklijke Philips on June 30 for "Enhancing angiograms" (French Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,566, issued on June 30, was assigned to Koninklijke Philips N.V. (Eindhoven, Netherlands). "Enhancing angiograms" was invented by Vincent M... और पढ़ें


US Patent Issued to International Business Machines on June 30 for "Video conference appearance validation and remediation" (Texas, New York, Minnesota Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,567, issued on June 30, was assigned to International Business Machines Corp. (Armonk, N.Y.). "Video conference appearance validation and r... और पढ़ें


US Patent Issued to Norfolk Southern on June 30 for "Machine-learning framework for detecting defects or conditions of railcar systems" (California, Georgia Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,568, issued on June 30, was assigned to Norfolk Southern Corp. (Atlanta). "Machine-learning framework for detecting defects or conditions o... और पढ़ें


US Patent Issued to Tokyo Electron on June 30 for "Substrate analysis system, substrate analysis method, and recording medium" (Japanese Inventor)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,569, issued on June 30, was assigned to Tokyo Electron Ltd. (Tokyo). "Substrate analysis system, substrate analysis method, and recording m... और पढ़ें


US Patent Issued to Carl Zeiss SMT on June 30 for "3D volume inspection method and method of configuring of a 3D volume inspection method" (German, American Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,570, issued on June 30, was assigned to Carl Zeiss SMT GmbH (Oberkochen, Germany). "3D volume inspection method and method of configuring o... और पढ़ें


US Patent Issued to Mitsubishi Electric Research Laboratories on June 30 for "System and method for tomographic imaging" (Massachusetts Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,571, issued on June 30, was assigned to Mitsubishi Electric Research Laboratories Inc. (Cambridge, Mass.). "System and method for tomograph... और पढ़ें


US Patent Issued to BEIJING BOE TECHNOLOGY DEVELOPMENT, BOE TECHNOLOGY GROUP on June 30 for "Image recognition method and system with improved accuracy of recognizing defect, and training method and an electronic device" (Chinese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,572, issued on June 30, was assigned to BEIJING BOE TECHNOLOGY DEVELOPMENT Co. LTD. (Beijing) and BOE TECHNOLOGY GROUP Co. LTD. (Beijing). ... और पढ़ें


US Patent Issued to SAMSUNG SDI, NSYS on June 30 for "System for finding black spots in a separator from a rechargeable battery cell" (South Korean Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,573, issued on June 30, was assigned to SAMSUNG SDI Co. LTD. (Yongin-si, South Korea) and NSYS Corp.. "System for finding black spots in a ... और पढ़ें