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US Patent Issued to HITACHI HIGH-TECH on July 7 for "Defect inspection device and defect inspection method" (Japanese Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,764, issued on July 7, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Defect inspection device and defect inspection method" was invented... और पढ़ें


US Patent Issued to Tokyo Electron on July 7 for "Reflecting non-planar surfaces integrated with laser scan for Poseidon tool integration" (Florida, Texas, New York Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,765, issued on July 7, was assigned to Tokyo Electron Ltd. (Tokyo). "Reflecting non-planar surfaces integrated with laser scan for Poseidon ... और पढ़ें


US Patent Issued to California Institute of Technology on July 7 for "Systems and methods for high-resolution soil and vegetation moisture content monitoring using full polarimetric global navigation satellite system (GNSS) signals" (California Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,767, issued on July 7, was assigned to California Institute of Technology (Pasadena, Calif.). "Systems and methods for high-resolution soil ... और पढ़ें


US Patent Issued to SEETHRU AI on July 7 for "X-ray scanning system and method for inspecting an object" (Massachusetts Inventor)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,769, issued on July 7, was assigned to SEETHRU AI INC. (Chelmsford, Mass.). "X-ray scanning system and method for inspecting an object" was ... और पढ़ें


US Patent Issued to Hitachi High-Tech on July 7 for "Inspection device and inspection method" (Japanese Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,770, issued on July 7, was assigned to Hitachi High-Tech Corp. (Tokyo). "Inspection device and inspection method" was invented by Takashi Hi... और पढ़ें


US Patent Issued to VERSITECH on July 7 for "Methods and apparatus for integrating diamond with LED towards on-chip quantum sensing" (Chinese Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,771, issued on July 7, was assigned to VERSITECH Ltd. (Hong Kong). "Methods and apparatus for integrating diamond with LED towards on-chip q... और पढ़ें


US Patent Issued to Okuma on July 7 for "Thermal displacement estimating method for machine tool and machine tool" (Japanese Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,772, issued on July 7, was assigned to Okuma Corp. (Niwa-Gun, Japan). "Thermal displacement estimating method for machine tool and machine t... और पढ़ें


US Patent Issued to Oxford University Innovation on July 7 for "Reference electrode" (British Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,774, issued on July 7, was assigned to Oxford University Innovation Ltd. (Oxford, Great Britain). "Reference electrode" was invented by Rich... और पढ़ें


US Patent Issued to KLA on July 7 for "Non-reagent chloride analysis in acid copper plating baths" (New Jersey, New York Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,775, issued on July 7, was assigned to KLA Corp. (Milpitas, Calif.). "Non-reagent chloride analysis in acid copper plating baths" was invent... और पढ़ें


US Patent Issued to Brewer Science on July 7 for "Electrochemical sensors for analyte detection in water and reference correction method" (Missouri, California Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,776, issued on July 7, was assigned to Brewer Science Inc. (Rolla, Mo.). "Electrochemical sensors for analyte detection in water and referen... और पढ़ें