ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,754, issued on July 7, was assigned to MET Co. Ltd. (Seoul, South Korea). "Method for detecting target biomolecule in biological sample, dis... और पढ़ें
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,755, issued on July 7, was assigned to Asahi Kasei Microdevices Corp. (Tokyo). "Optical density measuring apparatus" was invented by Takaaki... और पढ़ें
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,756, issued on July 7, was assigned to ATOMIC ENERGY OF CANADA Ltd./ENERGIE ATOMIQUE DU CANADA LIMITEE. "Method and apparatus for detecting ... और पढ़ें
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,757, issued on July 7, was assigned to Corrosion Innovations LLC (Houston). "Method of preparing surfaces comprising inspecting surface" was... और पढ़ें
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,758, issued on July 7, was assigned to EUROIMMUN Medizinische Labordiagnostika AG (Lubeck, Germany). "Method and device for detecting at lea... और पढ़ें
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,759, issued on July 7, was assigned to Canon K.K. (Tokyo). "Processing apparatus, processing system, processing method, and storage medium" ... और पढ़ें
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,760, issued on July 7, was assigned to LASERTEC Corp. (Yokohama, Japan). "Optical apparatus and focus correction method" was invented by Min... और पढ़ें
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,761, issued on July 7, was assigned to PlayNitride Display Co. Ltd. (MiaoLi County, Taiwan). "Defect detection and removal apparatus and met... और पढ़ें
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,762, issued on July 7, was assigned to MICROTEC S.p.A. (Bressanone, Italy). "Modular apparatus for the inspection of industrial products and... और पढ़ें
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,763, issued on July 7, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Optical-type foreign matter inspection device" was invented by Tomo... और पढ़ें