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US Patent Issued to SIGMASTAR TECHNOLOGY on April 14 for "Voltage detector device having trimming mechanism and voltage detection method" (Chinese, Taiwanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,770, issued on April 14, was assigned to SIGMASTAR TECHNOLOGY LTD. (Xiamen, China). "Voltage detector device having trimming mechanism and... Read More


US Patent Issued to Wago Verwaltungsgesellschaft mbH on April 14 for "Sensor device for an electrical terminal arrangement, electrical terminal arrangement, electrical terminal block, switchgear cabinet and read-out device" (German Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,771, issued on April 14, was assigned to Wago Verwaltungsgesellschaft mbH (Minden, Germany). "Sensor device for an electrical terminal arr... Read More


US Patent Issued to Jilin University on April 14 for "Energy consumption decomposition method of electric vehicle, analysis method, system, device and medium" (Chinese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,772, issued on April 14, was assigned to Jilin University (Changchun City, China). "Energy consumption decomposition method of electric ve... Read More


US Patent Issued to SHENZHEN GOODIX TECHNOLOGY on April 14 for "Detection circuit and related electronic apparatus" (Chinese Inventor)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,773, issued on April 14, was assigned to SHENZHEN GOODIX TECHNOLOGY Co. LTD. (Guangdong, China). "Detection circuit and related electronic... Read More


US Patent Issued to INVENSENSE on April 14 for "Low noise readout interface for capacitive sensors with negative capacitance" (Polish, Italian Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,774, issued on April 14, was assigned to INVENSENSE INC. (San Jose, Calif.). "Low noise readout interface for capacitive sensors with nega... Read More


US Patent Issued to CEYEAR TECHNOLOGIES on April 14 for "Method and system for testing conversion losses of terahertz mixers capable of eliminating influence of radio frequency sources" (Chinese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,775, issued on April 14, was assigned to CEYEAR TECHNOLOGIES Co. LTD. (Qingdao, China). "Method and system for testing conversion losses o... Read More


US Patent Issued to Qualtec on April 14 for "Power-semiconductor-device test apparatus facilitating test-connection changes" (Japanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,776, issued on April 14, was assigned to Qualtec Co. Ltd. (Osaka-fu, Japan). "Power-semiconductor-device test apparatus facilitating test-... Read More


US Patent Issued to Industrial Technology Research Institute on April 14 for "Inspection system and method for inspecting light-emitting diodes" (Taiwanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,777, issued on April 14, was assigned to Industrial Technology Research Institute (Hsinchu, Taiwan). "Inspection system and method for ins... Read More


US Patent Issued to SK HYNIX, FEMTOMETRIX on April 14 for "Field-biased nonlinear optical metrology using corona discharge source" (South Korean, American Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,778, issued on April 14, was assigned to SK HYNIX INC. (Icheon-si, South Korea) and FEMTOMETRIX INC. (Los Angeles). "Field-biased nonlinea... Read More


US Patent Issued to Sandisk Technologies on April 14 for "Determining a back drilling depth for a printed circuit board using a printed circuit board test coupon" (California Inventor)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,779, issued on April 14, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.). "Determining a back drilling depth for a printed ci... Read More