US Patent Issued to Industrial Technology Research Institute on April 14 for "Inspection system and method for inspecting light-emitting diodes" (Taiwanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,777, issued on April 14, was assigned to Industrial Technology Research Institute (Hsinchu, Taiwan).

"Inspection system and method for inspecting light-emitting diodes" was invented by Yan-Rung Lin (Hsinchu, Taiwan), Chung-Lun Kuo (New Taipei, Taiwan) and Chia-Liang Yeh (Hsinchu County, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection system includes an excitation light source, a voltage-sensing film, an illumination light source, an image capture device. The excitation light source provides an excitation beam to light-emitting diodes to generate open-circuit voltages. The voltage-sensing film is at a top side of the light-emitti...